OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization-Reference-Cited by-同舟云学术

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OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization

Published:2016-06 Issue:6 Volume:63 Page:583-587
ISSN:1549-7747
Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
language:
Short-container-title:IEEE Trans. Circuits Syst. II

Author:

L'Esperance Nicholai,Platt Timothy,Slamani Mustapha,Xia Tian

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8920/7478681/07412725.pdf?arnumber=7412725

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection;Ain Shams Engineering Journal;2021-06

2. New Digital Testing of Analogue Circuits Based on Frequency Band Classification;2020 7th International Conference on Electrical and Electronics Engineering (ICEEE);2020-04

3. TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither;Journal of Advanced Computational Intelligence and Intelligent Informatics;2019-01-20

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