Auto-Configuration Write Scheme With Enhanced Reliability for 3-D Cross-Point PCM-Reference-Cited by-同舟云学术

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Auto-Configuration Write Scheme With Enhanced Reliability for 3-D Cross-Point PCM

Published:2023 Issue: Volume: Page:1-1
ISSN:1549-7747
Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
language:
Short-container-title:IEEE Trans. Circuits Syst. II

Author:

Zhang Guangming¹,Lei Yu²^ORCID,Song Zhitang²^ORCID,Yu Qiuyao²,Chen Houpeng²^ORCID

Affiliation:

1. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Shanghai, China

2. Shanghai Institute of Microsystem and Information Technology, State Key Laboratory of Functional Materials for Informatics, Chinese Academy of Sciences, Shanghai, China

Funder

National Natural Science Foundation of China

Science and Technology Council of Shanghai

Strategic Priority Research Program of the Chinese Academy of Sciences

Youth Innovation Promotion Association of the Chinese Academy of Sciences

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8920/4358609/10238841.pdf?arnumber=10238841

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