A 25-mV-Sensitivity 2-Gb/s Optimum-Logic-Threshold Capacitive-Coupling Receiver for Wireless Wafer Probing Systems
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx5/8920/5235151/05208387.pdf?arnumber=5208387
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Contactless scribe-test monitor with photovoltaic power, VLC downlink and IR-UWB uplink;Analog Integrated Circuits and Signal Processing;2021-05-08
2. Low-Power Receivers for Wireless Capacitive Coupling Transmission in 3-D-Integrated Massively Parallel CMOS Imager;IEEE Transactions on Circuits and Systems I: Regular Papers;2020-08
3. A 32 Gb/s Bidirectional 4-channel 4 pJ/b Capacitively Coupled Link in 14 nm CMOS for Proximity Communication;IEEE Journal of Solid-State Circuits;2016-12
4. High-Frequency Testing of Vertical Interconnection Array Using Indirect Contact Probing Method With an Improved Calibration;IEEE Transactions on Components, Packaging and Manufacturing Technology;2016-11
5. A 40 nm CMOS I/O Pad Design With Embedded Capacitive Coupling Receiver for Non-Contact Wafer Probe Test;IEEE Transactions on Circuits and Systems I: Regular Papers;2015-07
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