Fourier Ptychography-based VCSEL array spots imaging quality enhancement
Author:
Affiliation:
1. Jiangnan University,School of Internet of Things Engineering, Engineering Research Center of Internet of Things Technology Applications of Ministry of Education,Wuxi,China
Funder
Natural Science Foundation of Jiangsu Province
China Postdoctoral Science Foundation
National Natural Science Foundation of China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10221568/10221569/10221584.pdf?arnumber=10221584
Reference7 articles.
1. Tunable-illumination for laser Fourier ptychographic microscopy based on a background noise-reducing system
2. Beam quality measurements with Shack-Hartmann wavefront sensor and M2-sensor: comparison of two methods;kudryashov;Proc Laser Resonators and Beam Control IX2007,0
3. research on measuring energy of laser’s near field spot by CCD photograph law;quan yi;Optoelectronic Technology,2018
4. Wide-field Fourier ptychographic microscopy using laser illumination source
5. Wide-field, high-resolution Fourier ptychographic microscopy
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