NS3K: A 3nm Nanosheet FET Library for VLSI Prediction in Advanced Nodes
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9401028/9401051/09401055.pdf?arnumber=9401055
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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3. Exploring Performance and Reliability Behavior of Nanosheet Channel Thin-Film Transistors under Independent Dual Gate Bias Operation;ECS Journal of Solid State Science and Technology;2023-10-01
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