Effects of Shallow Carbon and Deep N++ Layer on the Radiation Hardness of IHEP-IME LGAD Sensors
Author:
Affiliation:
1. Chinese Academy of Sciences, Institute of High Energy Physics, Beijing, China
2. Chinese Academy of Sciences, Institute of Microelectronics, Beijing, China
3. Jozef Stefan Institute, Ljubljana, Slovenia
Funder
National Natural Science Foundation of China
Hundred Talent Program of the Chinese Academy of Sciences
China Postdoctoral Science Foundation
CAS Center for Excellence in Particle Physics
Scientific Instrument Developing Project of the Chinese Academy of Sciences
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx7/23/9777895/09739028.pdf?arnumber=9739028
Reference28 articles.
1. Gain and time resolution of 45 μm thin Low Gain Avalanche Detectors before and after irradiation up to a fluence of 1015neq/cm2
2. Radiation campaign of HPK prototype LGAD sensors for the High-Granularity Timing Detector (HGTD)
3. Study of the radiation-induced damage mechanism in proton irradiated low gain avalanche detectors and its thermal annealing dependence
4. Radiation hardness of the low gain avalanche diodes developed by NDL and IHEP in China
5. The performance of IHEP-NDL LGAD sensors after neutron irradiation
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