Impact of Ring-Shaped Collector Contact on Total Ionizing Dose Susceptibility of Vertical n-p-n Bipolar Transistors-Reference-Cited by-同舟云学术

Impact of Ring-Shaped Collector Contact on Total Ionizing Dose Susceptibility of Vertical n-p-n Bipolar Transistors

Published:2022-11 Issue:11 Volume:69 Page:2222-2228
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Wei Jianan¹^ORCID,Zhang Peijian¹^ORCID,Shui Guohua²,Luo Ting¹,Chen Xian¹,Wu Yunchen¹,Hong Min¹,Tang Xinyue¹,Zhu Kunfeng²,Zhang Guangsheng²,Zhong Yi²,Fu Xiaojun¹,Tan Kaizhou¹,Wu Xue³

Affiliation:

1. Science and Technology on Analog Integrated Circuit Laboratory, Chongqing, China

2. Chongqing Semi-Chip Electronics Company Ltd., Chongqing, China

3. Chongqing Giga Chip Technology Company Ltd., Chongqing, China

Funder

National Natural Science Foundation of China

Foundation of National Innovation Center of Radiation Application

Special Foundation for Postdoctoral Research Project of Chongqing, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/9955238/09913954.pdf?arnumber=9913954

Reference34 articles.

1. Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures

2. Space charge limited degradation of bipolar oxides at low electric fields

3. Electronic traps andPbcenters at the Si/SiO2interface: Band‐gap energy distribution

4. Simulation methodology for dose effects in lateral DMOS transistors

5. Impact of Low Temperatures $({< 125}~{\rm K})$ on the Total Ionizing Dose Response and ELDRS in Gated Lateral PNP BJTs

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anomalous TID Susceptibility on Collector Bias for SOI High-Voltage Polysilicon Emitter Bipolar Transistors;IEEE Transactions on Electron Devices;2024-07