Author:
Brisbin D.,Mirgorodski Y.,Chaparala P.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Cold Carrier Injection Mechanism for Gate Oxide Integrity of High Voltage NDMOS;IEEE Transactions on Electron Devices;2022-06
2. Anomalous NMOSFET hot carrier degradation on DRAM;2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA);2021-11-24