Author:
McAndrew Colin C.,Lim Ik-Sung,Braswell Brandt,Garrity Doug
Cited by
4 articles.
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1. Improvements to Statistical Characterization and Modeling, and a Caution to be Aware of Spurious Correlation in Statistical Simulation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
2. AIDA-C Variation-Aware Circuit Synthesis Tool;Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies;2020
3. Introduction;Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies;2020
4. Compact Models for MOS Transistors: Successes and Challenges;IEEE Transactions on Electron Devices;2019-01