Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space
Author:
Sun Shupeng,Li Xin
Cited by
2 articles.
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1. Adaptive Planning Search Algorithm for Analog Circuit Verification;2023 International Semiconductor Conference (CAS);2023-10-11
2. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation;Proceedings of the 54th Annual Design Automation Conference 2017;2017-06-18