Fine-grained characterization of process variation in FPGAs

Author:

Yu Haile,Xu Qiang,Leong Philip H.W.

Publisher

IEEE

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Entropy Analysis of FPGA Interconnect and Switch Matrices for Physical Unclonable Functions;Cryptography;2024-07-15

2. Improving the Reliability of FPGA CRO PUFs;2023 33rd International Conference on Field-Programmable Logic and Applications (FPL);2023-09-04

3. Inducing Non-uniform FPGA Aging Using Configuration-based Short Circuits;ACM Transactions on Reconfigurable Technology and Systems;2022-06-06

4. Investigation of the Timing Parameters of The Arbiter-Based Physically Unclonable Function Using a Ring Oscillator;Digital Transformation;2022-06-02

5. Process Variability Analysis in Interconnect, Logic, and Arithmetic Blocks of 16-nm FinFET FPGAs;ACM Transactions on Reconfigurable Technology and Systems;2021-09-30

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