Author:
Satoh N.,Sasaki M.,Yuge T.,Yanagi S.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
25 articles.
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1. Analysis of k-Out-of-N-Systems with Different Units under Simultaneous Failures: A Matrix-Analytic Approach;Mathematics;2022-06-02
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