Deterioration Behavior Analysis and LSTM-Based Failure Prediction of GIB Electrical Contact Inside Various Insulation Gases-Reference-Cited by-同舟云学术

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Deterioration Behavior Analysis and LSTM-Based Failure Prediction of GIB Electrical Contact Inside Various Insulation Gases

Published:2020 Issue: Volume:8 Page:152367-152376
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Guan Xiangyu^ORCID,Wen Yuequan,Dong Zhe,Shu Naiqiu,Peng Hui,Gao Wei^ORCID,Gao David Wenzhong

Funder

National Science Foundation of China

China Scholarship Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/8948470/09169902.pdf?arnumber=9169902

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Contact Failure Characteristic Test and Overheating Analysis of UHV GIL Electrical Connection Structure;IEEE Transactions on Dielectrics and Electrical Insulation;2023-10

2. Contact Failure Diagnosis for GIS Plug-In Connector by Magnetic Field Measurements and Deep Neural Network Classifiers;IEEE Canadian Journal of Electrical and Computer Engineering;2022

3. Modeling and Analysis of Water Injection Cooling Molding System;IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society;2021-10-13

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