Allocation of FACTS Devices Using a Probabilistic Multi-Objective Approach Incorporating Various Sources of Uncertainty and Dynamic Line Rating
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science
Link
http://xplorestaging.ieee.org/ielx7/6287639/8948470/09195419.pdf?arnumber=9195419
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