The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review-Reference-Cited by-同舟云学术

The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review

Author:

Kanwal Neel¹^ORCID,Perez-Bueno Fernando²^ORCID,Schmidt Arne²^ORCID,Engan Kjersti¹^ORCID,Molina Rafael²^ORCID

Affiliation:

1. Department of Electrical Engineering and Computer Science, University of Stavanger, Stavanger, Norway

2. Department of Computer Science and Artificial Intelligence, University of Granada, Granada, Spain

Funder

European Union‘s Horizon 2020 Research and Innovation Program through Marie Skłodowska-Curie

(CLoud ARtificial Intelligence For pathologY

Ministerio de Ciencia e Innovación (MCIN)/Agencia Estatal de Investigación

Fondo Europeo de Desarrollo Regional (FEDER)/Junta de Andalucía-Consejería de Transformación Económica, Industria, Conocimiento y Universidades

Ministerio de Ciencia e Innovación

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

Reference136 articles.

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