Deep Learning Based Classification of Military Cartridge Cases and Defect Segmentation
Author:
Affiliation:
1. Department of Computer Engineering, Ankara University, Ankara, Turkey
2. Department of Computer Engineering, National Defense University, Ankara, Turkey
Funder
Ministry of Science, Industry and Technology of Türkiye
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09830740.pdf?arnumber=9830740
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