MA-YOLO: A Method for Detecting Surface Defects of Aluminum Profiles With Attention Guidance-Reference-Cited by-同舟云学术

MA-YOLO: A Method for Detecting Surface Defects of Aluminum Profiles With Attention Guidance

Author:

Jiang Lingjie¹^ORCID,Yuan Baoxi¹^ORCID,Wang Yuqian²,Ma Yahong¹,Du Jiawei³^ORCID,Wang Feng¹^ORCID,Guo Jianxin¹^ORCID

Affiliation:

1. School of Electronic Information, Xijing University, Xi’an, China

2. Graduate Office, Xijing University, Xi’an, China

3. School of Computer Science, Xijing University, Xi’an, China

Funder

Foundation of Shaanxi Key Laboratory of Integrated and Intelligent Navigation

Natural Science Foundation of Shaanxi Province

Research Foundation for Talented Scholars of Xijing University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

Reference54 articles.

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