Performance Dependence on System Parameters in Millimeter-Wave Active Imaging Based on Complex-Valued Neural Networks to Classify Complex Texture
Author:
Funder
JSPS KAKENHI
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science
Link
http://xplorestaging.ieee.org/ielx7/6287639/7859429/08036195.pdf?arnumber=8036195
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