Non-Profiled Side-Channel Attack Based on Deep Learning Using Picture Trace-Reference-Cited by-同舟云学术

Non-Profiled Side-Channel Attack Based on Deep Learning Using Picture Trace

Published:2021 Issue: Volume:9 Page:22480-22492
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Won Yoo-Seung^ORCID,Han Dong-Guk^ORCID,Jap Dirmanto^ORCID,Bhasin Shivam^ORCID,Park Jong-Yeon

Funder

“National Integrated Centre of Evaluation”

a facility of Cyber Security Agency (CSA), Singapore

Institute for Information Communications Technology Promotion (IITP) Grant funded by the Korea Government (MSIT) for Development of SCR-Friendly Symmetric Key Cryptosystem and Its Application Modes

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/9312710/09343317.pdf?arnumber=9343317

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