Rearrangement Method of Reducing Fault Location Error in Tied Uncompleted Parallel Lines-Reference-Cited by-同舟云学术

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Rearrangement Method of Reducing Fault Location Error in Tied Uncompleted Parallel Lines

Published:2022 Issue: Volume:10 Page:51862-51872
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Torkaman Hooman¹,Zeraatkar Ehsan²,Deyhimi Nasim³,Alhelou Hassan Haes⁴^ORCID,Siano Pierluigi⁵^ORCID

Affiliation:

1. Fars Regional Electric Company, Shiraz, Iran

2. Shiraz Urban Railway Organization, Shiraz, Iran

3. Parsia Afzar Fara Andishan Novin, Shiraz, Iran

4. Department of Electrical Power Engineering, Tishreen University, Lattakia, Syria

5. Department of Management and Innovation Systems, University of Salerno, Salerno, Italy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/6287639/9668973/09771404.pdf?arnumber=9771404

Reference24 articles.

1. Transmission Line Fault Location Using PCA-Based Best-Fit Curve Analysis

2. An accurate fault location algorithm using synchronized sampling

3. Automated transmission line fault analysis using synchronized sampling at two ends

4. A New Two-Terminal Numerical Algorithm for Fault Location, Distance Protection, and Arcing Fault Recognition

5. A Fault Location Technique for Two-Terminal Multisection Compound Transmission Lines Using Synchronized Phasor Measurements

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Artificial Neural Networks-Based Fault Localization in Distributed Generation Integrated Networks Considering Fault Impedance;IEEE Access;2024

2. Research on Fault Location Technology of Overhead Line Based on Non-Contact High Sensitivity Distributed Traveling Wave;Journal of Nanoelectronics and Optoelectronics;2022-09-01

3. Economical Setting-Free Double-Ended Fault Locator for Transmission Lines: Experiences From Recent Pilot Installations;IEEE Access;2022

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