Voltage Equivalence of Partial Discharge Tests for XLPE Insulation Defects-Reference-Cited by-同舟云学术

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Voltage Equivalence of Partial Discharge Tests for XLPE Insulation Defects

Published:2022 Issue: Volume: Page:1-1
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Chen Yun,Hao Yanpeng,Huang Tao,Xiao Jiapeng,Hui Baojun,Chen Yanwen,Yang Lin,Li Licheng

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/94/9697065/09730853.pdf?arnumber=9730853

Reference25 articles.

1. IEEE Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF)(less than 1 Hz)

2. IEEE Guide for Field Testing of Shielded Power Cable Systems Rated 5 kV and Above with Damped Alternating Current (DAC) Voltage

3. Discussion of electrical and thermal aspects of offshore wind farms’ power cables reliability

4. Detection of Partial Discharges at Different AC Voltage Stresses in Power Cables

5. PD Recurrence in Cavities at Different Energizing Methods

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Partial Discharge Characteristics of Aviation Cables Under Composite Voltages;IEEE Transactions on Dielectrics and Electrical Insulation;2024-06

2. The Degradation Analysis of XLPE Materials Under Thermal Aging: A Comprehensive Study Through Partial Discharge Measurements and Structural Characterization Techniques;Transactions on Electrical and Electronic Materials;2024-04-12

3. A Method for Constructing Short-Time AC Voltage Generator to Evaluate Cable Conditions;IEEE Transactions on Industrial Electronics;2024

4. Partial discharge detection on power equipment using a magneto-resistive sensor;International Journal of Electrical Power & Energy Systems;2023-10

5. Partial Discharge Characteristics and Mechanism of Medium Voltage Power Cable Defects under Different Voltage Stresses;IEEJ Transactions on Electrical and Electronic Engineering;2023-08-07

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