Modeling of Surface Trapping Effect on Charge Accumulation Pattern at Gas–Solid Interface in DC GIL-Reference-Cited by-同舟云学术

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Modeling of Surface Trapping Effect on Charge Accumulation Pattern at Gas–Solid Interface in DC GIL

Published:2024-02 Issue:1 Volume:31 Page:466-476
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Wang Zheming¹^ORCID,Wang Yaogang¹^ORCID,Ding Hao²,Jia Bowen¹^ORCID,Zhou Wenqiang¹,Lu Wu¹^ORCID,Liu Yongsheng³

Affiliation:

1. School of Electrical, Shanghai University of Electric Power, Shanghai, China

2. Institute of State Grid Yancheng Dafeng District Electric Power Company, Yancheng, China

3. Institute of Solar Energy, Shanghai University of Electric Power, Shanghai, China

Funder

National Natural Science Foundation of China

Program of Shanghai Academic/Technology Research Leader

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/94/10415316/10254600.pdf?arnumber=10254600

Reference29 articles.

1. Progress in Gas/Solid Interface Charging Phenomena

2. Direct Current Gas-Insulated Transmission Lines

3. Technical aspects of gas insulated transmission lines and application of new insulating gases

4. Analysis of factors influencing charge regulation at the DC GIL gas-solid interface;Wang;Proc. CSEE,2021

5. New experimental study on the DC flashover voltage of polymer insulators: combined effect of surface charges and air humidity

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