Degradation Behavior and Mechanism of Metalized Film Capacitor Under Ultrahigh Field
Author:
Affiliation:
1. State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China
Funder
National Science Foundation of China
State Grid Corporation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/94/10089236/10050153.pdf?arnumber=10050153
Reference26 articles.
1. Accelerated Ageing of Metallized Film Capacitors Under High Ripple Currents Combined With a DC Voltage
2. Investigation of performance degradation in metallized film capacitors
3. Self-healing Properties of Metalized Polypropylene Film with Elevated Sheet Resistance
4. Simulate the effect of trapped charges and trap cross-section on aging process
5. Linking Corrosion and Catastrophic Failure in Low-Power Metallized Polypropylene Capacitors
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