Author:
Xing Yunqi,Chen Yuanyuan,Yang Yang,Fabiani Davide,Mazzanti Giovanni,Zi Yunlong,Li Chuanyang
Funder
Young Scientists Fund
National Natural Science Foundation of China
State Key Laboratory of Reliability and Intelligence of Electrical Equipment
Hebei University of Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
1 articles.
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