A Proposed R-T Model for Atmospheric Corrosion of Metallized Film in AC Capacitors-Reference-Cited by-同舟云学术

A Proposed R-T Model for Atmospheric Corrosion of Metallized Film in AC Capacitors

Published:2022-12 Issue:6 Volume:29 Page:2258-2265
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Qiu Tian¹,Li Hua¹^ORCID,Li Zheng¹,Lin Fuchang¹,Zhang Guohao¹,Wang Zhehao¹,Wang Yucheng¹

Affiliation:

1. Key Laboratory of Advanced Electromagnetic Engineering and Technology, the Key Laboratory of Pulsed Power Technology, Ministry of Education, and the School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/94/9999164/09875328.pdf?arnumber=9875328

Reference18 articles.

1. Thin Oxide Films on Aluminum.

2. Hauffe—Ilschner Transition during Thermal Oxidation

3. Metal oxidation kinetics and the transition from thin to thick films

4. Pilling-Bedworth ratio for oxidation of alloys

5. The Mechanism of Oxidation of Metals—Theory

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1. Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering;IEEE Transactions on Power Electronics;2024-05

2. ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors;IEEE Transactions on Device and Materials Reliability;2023-12