Author:
Schiavone Pasquale Davide,Rossi Davide,Pullini Antonio,Di Mauro Alfio,Conti Francesco,Benini Luca
Cited by
36 articles.
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1. Measuring the SoC development process quality with Fault-slip-Through methodology;2024 13th Mediterranean Conference on Embedded Computing (MECO);2024-06-11
2. Reducing False Alarms in Wearable Seizure Detection With EEGformer: A Compact Transformer Model for MCUs;IEEE Transactions on Biomedical Circuits and Systems;2024-06
3. CIMR-V: An End-to-End SRAM-based CIM Accelerator with RISC-V for AI Edge Device;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19
4. Zero-Shot Classification Using Hyperdimensional Computing;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
5. A Customized Quad-Core RISC-V SoC for Energy Control Units;2024 IEEE 7th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC);2024-03-15