Author:
Rack M.,Nyssens L.,Raskin J. -P.,Lederer D.,Paganini A.,Shinde M. B.,Beganovic A.
Cited by
1 articles.
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1. Nox and Buried PN junctions effect on RF performance of High-Resistivity Silicon substrates;2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF);2022-01-16