1. Research of insulated gate bipolar transistor junction temperature measurement;mao,2013
2. Research on failures of bonding wire in IGBTs module;zhou;Journal of Power Supply,2016
3. Study of IGBT module aging failure base on bond wire equivalent resistance;peng;Trans China Electrotechn Soc,2017
4. A quasi-online method monitoring healthy state of bond wires in IGBTs based on module transconductance;li;Proc CSEE,7137
5. Research on condition monitoring for defects inside IGBT modules based on voltage drop of bond wires;gong;Journal of Power Supply,2016