Production deployment of a fast transient testing methodology for analog circuits: case study and results-Reference-Cited by-同舟云学术

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Production deployment of a fast transient testing methodology for analog circuits: case study and results

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Container-title:International Test Conference, 2003. Proceedings. ITC 2003.
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Author:

Voorakaranam R.,Newby R.,Cherubal S.,Cometta B.,Kuehl T.,Majernik D.,Chatterjee A.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8970/28457/01271106.pdf?arnumber=1271106

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10

2. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14

3. TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm;2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID);2016-01

4. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies;Microelectronics Journal;2015-11

5. A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy;2015 IEEE Computer Society Annual Symposium on VLSI;2015-07

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