Author:
Amyeen M. Enamul,Venkataraman Srikanth,Mak Mun Wai
Cited by
2 articles.
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1. Diagnosis of Scan Logic and Diagnosis Driven Failure Analysis[1];Microelectronics Failure Analysis;2019
2. BugMD;Proceedings of the 35th International Conference on Computer-Aided Design;2016-11-07