Author:
Gonciari P.T.,Al-Hashimi B.M.,Nicolici N.
Cited by
6 articles.
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1. An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis;IEEE Transactions on Instrumentation and Measurement;2012-04
2. Systems-on-Chip Testing;Reliability, Availability and Serviceability of Networks-on-Chip;2011-08-14
3. Power-aware multi-chains encoding scheme for system-on-a-chip in low-cost environment;IET Computers & Digital Techniques;2011
4. X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability;IEICE Transactions on Information and Systems;2005-07-01
5. Synchronization overhead in SOC compressed test;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2005-01