Author:
Lavo D.B.,Hartanto I.,Larrabee T.
Cited by
44 articles.
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1. Predicting the Resolution of Scan Diagnosis;2023 IEEE International Test Conference (ITC);2023-10-07
2. LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution;2020 IEEE International Test Conference (ITC);2020-11-01
3. New Targets for Diagnostic Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
4. A Deterministic-Statistical Multiple-Defect Diagnosis Methodology;2020 IEEE 38th VLSI Test Symposium (VTS);2020-04
5. Test Scores for Improving the Accuracy of Logic Diagnosis for Multiple Defects;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-07