Digital signature proposal for mixed-signal circuits-Reference-Cited by-同舟云学术

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Digital signature proposal for mixed-signal circuits

Published: Issue: Volume: Page:
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Container-title:Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
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Author:

Brosa A.M.,Figueras J.

Publisher

Int. Test Conference

Link

http://xplorestaging.ieee.org/ielx5/7183/19342/00894317.pdf?arnumber=894317

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Diagnosis of parametric defects in dual axis IC accelerometers;Microsystem Technologies;2014-05-22

2. A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources;Journal of Electronic Testing;2011-04-08

3. Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures;IEEE Transactions on Circuits and Systems I: Regular Papers;2009-04

4. Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE;2009 Asian Test Symposium;2009

5. Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling;2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems;2008-10

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