Author:
Chickermane V.,Foutz B.,Keller B.
Cited by
12 articles.
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1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Addressing Physically Aware Diagnosis Challenges in Hierarchical Core Based Designs;2023 IEEE International Test Conference India (ITC India);2023-07-23
3. Design and Performance Comparison of X-Masking Models in DFT Applications;2023 8th International Conference on Communication and Electronics Systems (ICCES);2023-06-01
4. Diagnosing Double Faulty Chains through Failing Bit Separation;2022 IEEE International Test Conference (ITC);2022-09
5. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09