Author:
Al-Ars Z.,Hamdioui S.,van de Goor A.J.,Mueller G.
Cited by
2 articles.
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1. SRAM Memory Testing Methods and Analysis;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-12-18
2. Fault Modeling and Analysis for Resistive Bridging Defects in a Synchronizer;Journal of Electronic Testing;2010-03-09