Author:
Engelke P.,Polian I.,Renovell M.,Becker B.
Cited by
13 articles.
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1. A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects;IEEE Transactions on Computers;2010-03
2. A case study on logic diagnosis for System-on-Chip;2009 10th International Symposium on Quality Electronic Design;2009-03
3. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2008-02
4. Improving Diagnosis Resolution without Physical Information;4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008);2008-01
5. X-masking during logic BIST and its impact on defect coverage;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2006-02