Effects of deterministic jitter in a cable on jitter tolerance measurements-Reference-Cited by-同舟云学术

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Effects of deterministic jitter in a cable on jitter tolerance measurements

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Container-title:International Test Conference, 2003. Proceedings. ITC 2003.
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Author:

Yamaguchi T.J.,Soma M.,Ishidal M.,Kurosawa M.,Musha H.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8970/28457/01270825.pdf?arnumber=1270825

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multi-Stage Jitter-Reduction and Frequency Multiplication for 54 GHz ATE Clocks;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test;2023 IEEE International Test Conference in Asia (ITC-Asia);2023-09-12

3. Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels;IEEE Transactions on Industrial Informatics;2008-05

4. Novel CMOS Circuits to Measure Data-Dependent Jitter, Random Jitter, and Sinusoidal Jitter in Real Time;IEEE Transactions on Microwave Theory and Techniques;2008-05

5. Source-synchronous testing of multilane PCI Express and HyperTransport buses;IEEE Design & Test of Computers;2006-01

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