A new methodology for improved tester utilization-Reference-Cited by-同舟云学术

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A new methodology for improved tester utilization

Published: Issue: Volume: Page:
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Container-title:Proceedings International Test Conference 2001 (Cat. No.01CH37260)
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Author:

Khoche A.,Kapur R.,Armstrong D.,Williams T.W.,Tegethoff M.,Rivoir J.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7640/20866/00966715.pdf?arnumber=966715

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex Mixed-Signal Devices;2015 IEEE 24th North Atlantic Test Workshop;2015-05

2. Multivariate measurement system analysis in multisite testing: An online technique using principal component analysis;Expert Systems with Applications;2011-11

3. A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips;26th IEEE VLSI Test Symposium (vts 2008);2008-04

4. Optimisation of on-chip design-for-test infrastructure for maximal multi-site test throughput;IEE Proceedings - Computers and Digital Techniques;2005

5. Modern test techniques: Tradeoffs, synergies, and scalable benefits;Journal of Electronic Testing;2003

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