Author:
Hennig F.,Hingarh H.K.,O'Brien D.,Verhofstadt P.W.J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
19 articles.
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1. References;Microprocessor 3;2020-11-06
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5. Beta measurement and beta requirement in I/sup 2/L gates;IEEE Journal of Solid-State Circuits;1982-02