Statistical Wavelet Subband Characterization Based on Generalized Gamma Density and Its Application in Texture Retrieval-Reference-Cited by-同舟云学术

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Statistical Wavelet Subband Characterization Based on Generalized Gamma Density and Its Application in Texture Retrieval

Published:2010-02 Issue:2 Volume:19 Page:281-289
ISSN:1057-7149
Container-title:IEEE Transactions on Image Processing
language:
Short-container-title:IEEE Trans. on Image Process.

Author:

Choy S.K.,Tong C.S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/83/5382628/05272112.pdf?arnumber=5272112

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