Author:
Bashir Muhammad Muqarrab,Milor Linda
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2015-04
2. A Survey of Yield Modeling and Yield Enhancement Methods;IEEE Transactions on Semiconductor Manufacturing;2013-05