High-frequency characterization of on-chip digital interconnects-Reference-Cited by-同舟云学术

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High-frequency characterization of on-chip digital interconnects

Published:2002-06 Issue:6 Volume:37 Page:716-725
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Kleveland B.,Xiaoning Qi ,Madden L.,Furusawa T.,Dutton R.W.,Horowitz M.A.,Wong S.S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/21689/01004576.pdf?arnumber=1004576

Cited by 46 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Modeling of CMS-based nonuniform interconnects using FDTD technique;International Journal of Circuit Theory and Applications;2018-10-01

3. On-Chip Spiral Inductors and On-Chip Spiral Transistors for Accurate Numerical Modeling;Journal of Magnetics;2018-03-31

4. Inductance Model of Interdigitated Power and Ground Networks;On-Chip Power Delivery and Management;2016

5. High-Frequency Devices;Graphene Optoelectronics;2014-08-15

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