Author:
Dale C.J.,Marshall P.W.,Burke E.A.,Summers G.P.,Bender G.E.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
42 articles.
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1. Statistical spread on the displacement damage degradation of irradiated semiconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-03
2. Radiation tests on the COTS image sensor from CMOSIS;International Conference on Space Optics — ICSO 2018;2019-07-12
3. About the scatter of displacement damage and its consequence on the NIEL scaling approach;2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2018-09
4. In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking;IEEE Transactions on Nuclear Science;2018-08
5. Comparison of Methods to Calculate the Dark Current Nonuniformity;IEEE Transactions on Nuclear Science;2018-07