Robust Ellipse Fitting Based on Maximum Correntropy Criterion With Variable Center-Reference-Cited by-同舟云学术

Robust Ellipse Fitting Based on Maximum Correntropy Criterion With Variable Center

Published:2023 Issue: Volume:32 Page:2520-2535
ISSN:1057-7149
Container-title:IEEE Transactions on Image Processing
language:
Short-container-title:IEEE Trans. on Image Process.

Author:

Wang Wei¹,Wang Gang¹^ORCID,Hu Chenlong¹^ORCID,Ho K. C.²^ORCID

Affiliation:

1. Faculty of Electrical Engineering and Computer Science and the Zhejiang Key Laboratory of Mobile Network Application Technology, Ningbo University, Ningbo, China

2. Electrical Engineering and Computer Science Department, University of Missouri, Columbia, MO, USA

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/83/9991910/10112625.pdf?arnumber=10112625

Reference47 articles.

1. ENHANCED DIRECT LEAST SQUARE FITTING OF ELLIPSES

2. Ellipse fitting by spatial averaging of random ensembles

3. Very Fast Best-Fit Circular and Elliptical Boundaries by Chord Data

4. Applications of second-order cone programming

5. Random sample consensus

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