Dependence of channel electric field on device scaling-Reference-Cited by-同舟云学术

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Dependence of channel electric field on device scaling

Published:1985-10 Issue:10 Volume:6 Page:551-553
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Chan T.Y.,Ko P.K.,Hu C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/31944/01485379.pdf?arnumber=1485379

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