Author:
Wang Gang,Lee Byunghak,Ma Guiying,Wang Nan,Tang Mike,Ding Kellin,zhou Breeze,Ju Jianhua
Cited by
2 articles.
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1. Low Frequency Noise and Hot Carrier Degradation Characteristics on 55nm LP Platform;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17
2. Testing Significance of Layout Dependent Impacts on Silicon Chips Performance;2023 3rd International Conference on Intelligent Technologies (CONIT);2023-06-23