High-temperature (>500°c) wall thickness monitoring using dry-coupled ultrasonic waveguide transducers-Reference-Cited by-同舟云学术

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High-temperature (>500°c) wall thickness monitoring using dry-coupled ultrasonic waveguide transducers

Published:2011-01 Issue:1 Volume:58 Page:156-167
ISSN:0885-3010
Container-title:IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
language:
Short-container-title:IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

Author:

Cegla F B,Cawley P,Allin J,Davies J

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Acoustics and Ultrasonics,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/58/5688388/05688409.pdf?arnumber=5688409

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