A GEANT-Based Model for Single Event Upsets in SRAM FPGAs for Use in On-Detector Electronics-Reference-Cited by-同舟云学术

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A GEANT-Based Model for Single Event Upsets in SRAM FPGAs for Use in On-Detector Electronics

Published:2006-08 Issue:4 Volume:53 Page:2353-2360
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Skutnik S.,Lajoie J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/35462/01684111.pdf?arnumber=1684111

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission;Journal of Electronic Testing;2024-04

2. A Self-Adaptive SEU Mitigation System for FPGAs with an Internal Block RAM Radiation Particle Sensor;2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines;2014-05

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