Direct Measurement of SET Pulse Widths in 0.2-$\mu$m SOI Logic Cells Irradiated by Heavy Ions-Reference-Cited by-同舟云学术

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Direct Measurement of SET Pulse Widths in 0.2-$\mu$m SOI Logic Cells Irradiated by Heavy Ions

Published:2006-12 Issue:6 Volume:53 Page:3575-3578
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Yanagawa Y.,Hirose K.,Saito H.,Kobayashi D.,Fukuda S.,Ishii S.,Takahashi D.,Yamamoto K.,Kuroda Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/4033181/04033981.pdf?arnumber=4033981

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