Author:
Lu Haiyan,Cheng Wei,Li Oupeng,Kong Yuechan,Chen Tangsheng
Cited by
2 articles.
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1. HBT High‐Frequency Modeling and Integrated Parameter Extraction;RF Circuits For 5G Applications;2023-03-15
2. InP DHBT test structure optimization towards 110 GHz characterization;ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC);2022-09-19